EPJ

Beta-decay properties of 25 Si and 26 P

J.-C. Thomas, L. Achouri, J. Äystö, R. Béraud, B. Blank, G. Canchel, S. Czajkowski, P. Dendooven, A. Ensallem, J. Giovinazzo et al. (9 more)
Eur. Phys. J. A, 21 3 (2004) 419-435
Published online: 07 September 2004
DOI: 10.1140/epja/i2003-10218-8

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