Precise half-life measurement of the 26Si ground state I. Matea, J. Souin, J. Äystö, B. Blank, P. Delahaye, V. -V. Elomaa, T. Eronen, J. Giovinazzo, U. Hager, J. Hakala et al. (11 more) Eur. Phys. J. A, 37 2 (2008) 151-158 Published online: 28 July 2008 DOI: 10.1140/epja/i2008-10623-5