EPJ

Exchange bias studies of NiFe/FeMn/NiFe trilayer by ion beam etching

V. K. Sankaranarayanan, D. Y. Kim, S. M. Yoon, C. O. Kim and C. G. Kim

Eur. Phys. J. B, 45 2 (2005) 203-206

Published online: 08 March 2005

DOI: 10.1140/epjb/e2005-00055-1

V. K. Sankaranarayanan

D. Y. Kim

S. M. Yoon

C. O. Kim

C. G. Kim

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