EPJ

Simulation of the delamination of thin films

S. Scarle, C. P. Ewels and M. I. Heggie

Eur. Phys. J. B, 46 4 (2005) 529-534

Published online: 07 September 2005

DOI: 10.1140/epjb/e2005-00285-1

S. Scarle

C. P. Ewels

M. I. Heggie

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