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Smearing origin of zero-bias conductance peak in Ag-SiO-Bi₂Sr₂CaCu₂O_8+δ planar tunnel junctions: influence of diffusive normal metal verified with the circuit theory

I. Shigeta, Y. Tanaka, F. Ichikawa and Y. Asano

Eur. Phys. J. B, 54 2 (2006) 141-149

Published online: 22 December 2006

DOI: 10.1140/epjb/e2006-00440-2

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