EPJ

Bayesian inference of high-purity germanium detector impurities based on capacitance measurements and machine-learning accelerated capacitance calculations

I. Abt, C. Gooch, F. Hagemann, L. Hauertmann, X. Liu, O. Schulz and M. Schuster

Eur. Phys. J. C, 83 5 (2023) 352

Published online: 03 May 2023

DOI: 10.1140/epjc/s10052-023-11509-8

I. Abt

C. Gooch

F. Hagemann

L. Hauertmann

X. Liu

O. Schulz

M. Schuster

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