EPJ

Electron attachment to doped helium droplets: C₆₀^-, (C₆₀)₂^-, and C₆₀D₂O^- anions

S. Jaksch, I. Mähr, S. Denifl, A. Bacher, O. Echt, T. D. Märk and P. Scheier

Eur. Phys. J. D, 52 1-3 (2009) 91-94

Published online: 24 January 2009

DOI: 10.1140/epjd/e2008-00252-6

S. Jaksch

I. Mähr

S. Denifl

A. Bacher

O. Echt

T. D. Märk

P. Scheier

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