EPJ

Measurement of the trapping lifetime close to a cold metallic surface on a cryogenic atom-chip

A. Emmert, A. Lupaşcu, G. Nogues, M. Brune, J.-M. Raimond and S. Haroche

Eur. Phys. J. D, 51 2 (2009) 173-177

Published online: 16 January 2009

DOI: 10.1140/epjd/e2009-00001-5

A. Emmert

A. Lupaşcu

G. Nogues

M. Brune

J.-M. Raimond

S. Haroche

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