EPJ

Dielectronic recombination rate coefficients for the Ni isoelectronic sequence

Y. Zhang, C. Y. Chen, M. Huang, Y. S. Wang and Y. M. Zou

Eur. Phys. J. D, 56 2 (2010) 157-166

Published online: 17 November 2009

DOI: 10.1140/epjd/e2009-00285-3

Y. Zhang

C. Y. Chen

M. Huang

Y. S. Wang

Y. M. Zou

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