EPJ

Sputter yields of Mo, Ti, W, Al, Ag under xenon ion incidence

M. Tartz, T. Heyn, C. Bundesmann, C. Zimmermann and H. Neumann

Eur. Phys. J. D, 61 3 (2011) 587-592

Published online: 18 February 2011

DOI: 10.1140/epjd/e2010-10553-8

M. Tartz

T. Heyn

C. Bundesmann

C. Zimmermann

H. Neumann

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