Sputter yield measurements of thin foils using scanning transmission ion microscopy Christoph Eichhorn, Darina Manova, René Feder, Ralf Wunderlich, Christel Nömayr, Claus G. Zimmermann and Horst Neumann Eur. Phys. J. D, 69 1 (2015) 19 Published online: 16 January 2015 DOI: 10.1140/epjd/e2014-50552-1