EPJ

Tetracene film morphology: Comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations

B. Gompf, D. Faltermeier, C. Redling, M. Dressel and J. Pflaum

Eur. Phys. J. E, 27 4 (2008) 421-424

Published online: 19 December 2008

DOI: 10.1140/epje/i2008-10405-5

B. Gompf

D. Faltermeier

C. Redling

M. Dressel

J. Pflaum

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