EPJ

Spatially calibrated elemental depth profiling using LIPS and 3D digital microscopy

S. Siano, I. Cacciari, A. Mencaglia and J. Agresti

Eur. Phys. J. Plus, 126 12 (2011) 120

Published online: 12 December 2011

DOI: 10.1140/epjp/i2011-11120-y

S. Siano

I. Cacciari

A. Mencaglia

J. Agresti

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