EPJ

Spectroscopic ellipsometry and electrical characterizations of InGaAs:Mg thin films lattice matched to InP

I. Zeydi, M. Ezzedini, A. Sayari, E. Shalaan, S. Wageh, L. Sfaxi, A. A. Al-Ghamdi and R. M’Gaieth

Eur. Phys. J. Plus, 131 6 (2016) 189

Published online: 09 June 2016

DOI: 10.1140/epjp/i2016-16189-0

I. Zeydi

M. Ezzedini

A. Sayari

E. Shalaan

S. Wageh

L. Sfaxi

A. A. Al-Ghamdi

R. M’Gaieth

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