EPJ

Geometric scattering in the presence of line defects

Hai Viet Bui, Ali Mostafazadeh and Sema Seymen

Eur. Phys. J. Plus, 136 1 (2021) 109

Published online: 20 January 2021

DOI: 10.1140/epjp/s13360-021-01108-5

Hai Viet Bui

Ali Mostafazadeh

Sema Seymen

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