EPJ

Hot carrier reliability assessment of vacuum gate dielectric trench MOSFET (TG-VacuFET)

Neha Gupta, Ajay Kumar and Aditya Jain

Eur. Phys. J. Plus, 137 4 (2022) 517

Published online: 28 April 2022

DOI: 10.1140/epjp/s13360-022-02745-0

Neha Gupta

Ajay Kumar

Aditya Jain

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