EPJ

Band alignment determination in few-layer exfoliated MoSe₂/SiO₂ interface using Synchrotron-based photoemission spectroscopy

Rahul, Sunil K. Arora, S. N. Jha and Yogesh Kumar

Eur. Phys. J. Plus, 137 6 (2022) 666

Published online: 06 June 2022

DOI: 10.1140/epjp/s13360-022-02894-2

Rahul

Sunil K. Arora

S. N. Jha

Yogesh Kumar

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