The development of IBIC microscopy at the 100 kV ion implanter of the University of Torino (LIUTo) and the application for the assessment of the radiation hardness of a silicon photodiode
Eur. Phys. J. Plus, 140 6 (2025) 609
Published online: 30 June 2025
DOI: 10.1140/epjp/s13360-025-06528-1