EPJ

Voltage fluctuation of CMOS NAND gate analysed with large deviations theory

Daigo Yoshino and Yasuhiro Tokura

Eur. Phys. J. Spec. Top., Publication ahead of print

Published online: 24 July 2025

DOI: 10.1140/epjs/s11734-025-01790-x

Daigo Yoshino

Yasuhiro Tokura

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