EPJ

Evaluation of elastic properties of nanoporous silicon oxide thin films by picosecond laser ultrasonics

C. Mechri, P. Ruello, V. Gusev, J. M. Breteau, D. Mounier, M. Henderson, A. Gibaud and S. Dourdain

Eur. Phys. J. Special Topics, 153 (2008) 211-213

Published online: 12 March 2008

DOI: 10.1140/epjst/e2008-00430-8

C. Mechri

P. Ruello

V. Gusev

J. M. Breteau

D. Mounier

M. Henderson

A. Gibaud

S. Dourdain

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