EPJ

Photoacoustic spectroscopy of surface defects states of semiconductor samples

M. Maliński, J. Zakrzewski and F. Firszt

Eur. Phys. J. Special Topics, 153 (2008) 251-254

Published online: 12 March 2008

DOI: 10.1140/epjst/e2008-00438-0

M. Maliński

J. Zakrzewski

F. Firszt

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