EPJ

Photocarrier radiometric characterization of electronic transport properties of H⁺ implanted silicon wafers

C. Wang, A. Mandelis, J. Tolev and J. Meijer

Eur. Phys. J. Special Topics, 153 (2008) 271-274

Published online: 12 March 2008

DOI: 10.1140/epjst/e2008-00443-3

C. Wang

A. Mandelis

J. Tolev

J. Meijer

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