EPJ

Analysis of free carrier absorption measurement of electronic transport properties of silicon wafers

X. Zhang, B. Li and C. Gao

Eur. Phys. J. Special Topics, 153 (2008) 279-281

Published online: 12 March 2008

DOI: 10.1140/epjst/e2008-00445-1

X. Zhang

B. Li

C. Gao

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