EPJ

Successive diffraction model based on Fourier optics as a tool for the studies of light interaction with arbitrary ultrasonic field

I. Grulkowski and P. Kwiek

Eur. Phys. J. Special Topics, 154 (2008) 77-83

Published online: 15 March 2008

DOI: 10.1140/epjst/e2008-00520-7

I. Grulkowski

P. Kwiek

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