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X-ray diffraction study of the composition and strain fields in buried SiGe islands

N. Hrauda, J. J. Zhang, M. Stoffel, J. Stangl, G. Bauer, A. Rehman-Khan, V. Holý, O. G. Schmidt, V. Jovanovic and L. K. Nanver

Eur. Phys. J. Special Topics, 167 (2009) 41-46

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00934-7

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