EPJ

Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures - MAD and DAFS for studying Semiconductor Nanostructures

V. Favre-Nicolin, M.G. Proietti, C. Leclere, N.A. Katcho, M.-I. Richard and H. Renevier

Eur. Phys. J. Special Topics, 208 (2012) 189-216

Published online: 15 June 2012

DOI: 10.1140/epjst/e2012-01619-x

V. Favre-Nicolin

M.G. Proietti

C. Leclere

N.A. Katcho

M.-I. Richard

H. Renevier

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