EPJ

Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface

S. Hudlet, M. Saint Jean, C. Guthmann and J. Berger

Eur. Phys. J. B, 2 1 (1998) 5-10

Published online: 15 March 1998

DOI: 10.1007/s100510050219

S. Hudlet

M. Saint Jean

C. Guthmann

J. Berger

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