EPJ

Formation of porous silicon: an in situ investigation with high-resolution X-ray diffraction

V. Chamard, C. Pichat and G. Dolino

Eur. Phys. J. B, 21 2 (2001) 185-190

Published online: 15 May 2001

DOI: 10.1007/s100510170194

V. Chamard

C. Pichat

G. Dolino

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