EPJ

Atom probe tomography in nanoelectronics

Didier Blavette and Sébastien Duguay

Eur. Phys. J. Appl. Phys., 68 1 (2014) 10101

Published online: 26 September 2014

DOI: 10.1051/epjap/2014140060

Didier Blavette

Sébastien Duguay

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