EPJ

Development of a new database for Auger electron and X-ray spectra

B. P. E. Tee, T. Kibédi, B. Q. Lee, M. Vos, R. du Rietz and A. E. Stuchbery

EPJ Web Conf., 232 (2020) 01006

Published online: 06 April 2020

DOI: 10.1051/epjconf/202023201006

B. P. E. Tee

T. Kibédi

B. Q. Lee

M. Vos

R. du Rietz

A. E. Stuchbery

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