RDDS lifetime measurement with JUROGAM + RITU T. Grahn, A. Dewald, O. Möller, C. W. Beausang, S. Eeckhaudt, P. T. Greenlees, J. Jolie, P. Jones, R. Julin, S. Juutinen et al. (15 more) Eur. Phys. J. A, 25 3 (2005) 441-442 Published online: 18 April 2005 DOI: 10.1140/epjad/i2005-06-024-2