Exchange bias on epitaxial Ni films due to ultrathin NiO layer R. A. Lukaszew, M. Mitra, Z. Zhang and M. Yeadon Eur. Phys. J. B, 45 2 (2005) 181-184 Published online: 28 June 2005 DOI: 10.1140/epjb/e2005-00183-6