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Intrinsic pinning and current percolation signatures in E-J characteristics of Si/YSZ/CeO₂/YBCO layouts

D. Botta, C. Camerlingo, A. Chiodoni, F. Fabbri, R. Gerbaldo, G. Ghigo, L. Gozzelino, F. Laviano, B. Minetti, C. F. Pirri et al. (4 more)

Eur. Phys. J. B, 48 3 (2005) 359-365

Published online: 23 December 2005

DOI: 10.1140/epjb/e2005-00413-y

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