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Residual strain measurements in InGaAs metamorphic buffer layers on GaAs

V. Bellani, C. Bocchi, T. Ciabattoni, S. Franchi, P. Frigeri, P. Galinetto, M. Geddo, F. Germini, G. Guizzetti, L. Nasi et al. (3 more)

Eur. Phys. J. B, 56 3 (2007) 217-222

Published online: 13 April 2007

DOI: 10.1140/epjb/e2007-00105-8

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