EPJ

Thickness dependence of photoluminescence-decay profiles of exciton-exciton scattering in ZnO thin films

Shuji Wakaiki, Hideki Ichida, Toshiki Kawase, Kohji Mizoguchi, DaeGwi Kim, Masaaki Nakayama and Yasuo Kanematsu

Eur. Phys. J. B, 86 9 (2013) 387

Published online: 18 September 2013

DOI: 10.1140/epjb/e2013-30631-5

Shuji Wakaiki

Hideki Ichida

Toshiki Kawase

Kohji Mizoguchi

DaeGwi Kim

Masaaki Nakayama

Yasuo Kanematsu

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