EPJ

Transport properties of Si ions moving through He gas

Syham Lias, Larry Viehland and Meriem Haine

Eur. Phys. J. D, 79 5 (2025) 59

Published online: 26 May 2025

DOI: 10.1140/epjd/s10053-025-00999-8

Syham Lias

Larry Viehland

Meriem Haine

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