EPJ

Measurement of adhesion energies and Young's modulus in thin polymer films using a novel axi-symmetric peel test geometry

A. N. Raegen, K. Dalnoki-Veress, K. -T. Wan and R. A. L. Jones

Eur. Phys. J. E, 19 4 (2006) 453-459

Published online: 18 April 2006

DOI: 10.1140/epje/i2005-10069-7

A. N. Raegen

K. Dalnoki-Veress

K. -T. Wan

R. A. L. Jones

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)