EPJ

Ellipsometry measurements of glass transition breadth in bulk films of random, block, and gradient copolymers

M. M. Mok, J. Kim, S. R. Marrou and J. M. Torkelson

Eur. Phys. J. E, 31 3 (2010) 239-252

Published online: 09 March 2010

DOI: 10.1140/epje/i2010-10569-3

M. M. Mok

J. Kim

S. R. Marrou

J. M. Torkelson

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)