EPJ

Measurement of sheet resistance of GaN films on a dielectric substrate

Bartlomiej Salski, Jerzy Krupka and Pawel Kopyt

Eur. Phys. J. Plus, 129 8 (2014) 184

Published online: 27 August 2014

DOI: 10.1140/epjp/i2014-14184-1

Bartlomiej Salski

Jerzy Krupka

Pawel Kopyt

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