EPJ

Structural, morphological and optical characterizations of ZnO:Al thin films grown on silicon substrates by pulsed laser deposition

A. Alyamani, A. Sayari, A. Albadri, H. Albrithen and L. El Mir

Eur. Phys. J. Plus, 131 9 (2016) 328

Published online: 21 September 2016

DOI: 10.1140/epjp/i2016-16328-7

A. Alyamani

A. Sayari

A. Albadri

H. Albrithen

L. El Mir

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