EPJ

Fractal analysis as a potential tool for surface morphology of thin films

S. Soumya, M. S. Swapna, Vimal Raj, V. P. Mahadevan Pillai and S. Sankararaman

Eur. Phys. J. Plus, 132 12 (2017) 551

Published online: 28 December 2017

DOI: 10.1140/epjp/i2017-11826-8

S. Soumya

M. S. Swapna

Vimal Raj

V. P. Mahadevan Pillai

S. Sankararaman

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