EPJ

Atomic-scale X-ray structural analysis of self-assembled monolayers on Silicon

J.-C. Lin, J. A. Kellar, J.-H. Kim, N. L. Yoder, K. H. Bevan, S. T. Nguyen, M. C. Hersam and M. J. Bedzyk

Eur. Phys. J. Special Topics, 167 (2009) 33-39

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00933-8

J.-C. Lin

J. A. Kellar

J.-H. Kim

N. L. Yoder

K. H. Bevan

S. T. Nguyen

M. C. Hersam

M. J. Bedzyk

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