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The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymers

S. Swaraj, C. Wang, T. Araki, G. Mitchell, L. Liu, S. Gaynor, B. Deshmukh, H. Yan, C. R. McNeill and H. Ade

Eur. Phys. J. Special Topics, 167 (2009) 121-126

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00946-3

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