EPJ

EPJ

a
b
d
e
ap
st
h
plus

c
ds
pv
ti
qt
am
n

woc
rnc

The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymers

S. Swaraj, C. Wang, T. Araki, G. Mitchell, L. Liu, S. Gaynor, B. Deshmukh, H. Yan, C. R. McNeill and H. Ade

Eur. Phys. J. Special Topics, 167 (2009) 121-126

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00946-3

This search tool will display articles in our database by authors of the selected article:

Search method:

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)