EPJ

Critical behavior of a filling-controlled Mott-transition observed at an organic field-effect-transistor interface

H.M. Yamamoto, J. Ueno and R. Kato

Eur. Phys. J. Special Topics, 222 5 (2013) 1057-1063

Published online: 15 July 2013

DOI: 10.1140/epjst/e2013-01906-0

H.M. Yamamoto

J. Ueno

R. Kato

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