EPJ

Penetration depth measurement in high quality YBa₂Cu₃O_7-x thin films

E. Farber, G. Deutscher, J. P. Contour and E. Jerby

Eur. Phys. J. B, 5 2 (1998) 159-162

Published online: 15 September 1998

DOI: 10.1007/s100510050429

E. Farber

G. Deutscher

J. P. Contour

E. Jerby

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)