EPJ

Scanning X-ray interferometry and the silicon lattice parameter: towards 10^-9 relative uncertainty?

A. Bergamin, G. Cavagnero, G. Mana and G. Zosi

Eur. Phys. J. B, 9 2 (1999) 225-232

Published online: 15 May 1999

DOI: 10.1007/s100510050760

A. Bergamin

G. Cavagnero

G. Mana

G. Zosi

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