EPJ

Excess thermal-noise in the electrical breakdown of random resistor networks

C. Pennetta, L. B. Kiss, Z. Gingl and L. Reggiani

Eur. Phys. J. B, 12 1 (1999) 61-65

Published online: 15 November 1999

DOI: 10.1007/s100510050977

C. Pennetta

L. B. Kiss

Z. Gingl

L. Reggiani

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