EPJ

Raman spectroscopy of optical phonons as a probe of GaN epitaxial layer structural quality

M. M. Bülbül, S. R.P. Smith, B. Obradovic, T. S. Cheng and C. T. Foxon

Eur. Phys. J. B, 14 3 (2000) 423-429

Published online: 15 April 2000

DOI: 10.1007/s100510051050

M. M. Bülbül

S. R.P. Smith

B. Obradovic

T. S. Cheng

C. T. Foxon

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