EPJ

Ising films with surface defects

M.-C. Chung, M. Kaulke, I. Peschel, M. Pleimling and W. Selke
Eur. Phys. J. B, 18 4 (2000) 655-661
Published online: 15 December 2000
DOI: 10.1007/s100510070014

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