EPJ

Whole diffraction pattern-fitting of polycrystalline fcc materials based on microstructure

P. Scardi, M. Leoni and Y. H. Dong

Eur. Phys. J. B, 18 1 (2000) 23-30

Published online: 15 November 2000

DOI: 10.1007/s100510070073

P. Scardi

M. Leoni

Y. H. Dong

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